Document Type
Poster
Publication Title
Northrop Grumman Engineering & Science Student Design Showcase
Abstract
With the production of new modules for the CMS Inner Tracker under way, a new system of quality control that could efficiently and effectively test samples from each batch needs to form hand in hand. Enter Panthera and Felis, which produce an Actionable Summary (AS) and grading rubric that serve to detect faults in module batches at each stage of manufacturing and assembly. Here we focus on the IV-Curve test of the bare modules for the CMS Readout Chips (CROCs) performed to ensure the integrity of the sensor, the CROCs, and the bump connectivity.
Advisor
Souvik Das
Publication Date
4-25-2025
Recommended Citation
Clemens, Connor, "Grading Systems for CMS Phase 2 Silicon Chips" (2025). Aerospace, Physics, and Space Science Student Publications. 60.
https://repository.fit.edu/apss_student/60