Document Type
Conference Proceeding
Publication Title
Proceedings of SPIE - the International Society for Optical Engineering
Abstract
Apertureless scattering-type Scanning Near-field Optical Microscopy (s-SNOM) has been used to study the electromagnetic response of infrared antennas below the diffraction limit. The ability to simultaneously resolve the phase and amplitude of the evanescent field relies on the implementation of several experimentally established background suppression techniques. We model the interaction of the probe with a patch antenna using the Finite Element Method (FEM). Green's theorem is used to predict the far-field, cross-polarized scattering and to construct the homodyne amplified signal. This approach allows study of important experimental phenomena, specifically the effects of the reference strength, demodulation harmonic, and detector location.
DOI
10.1117/12.2023513
Publication Date
9-20-2013
Recommended Citation
Ravichandran, A., Kinzel, E. C., Ginn, J. C., D'Archangel, J. A., Tucker, E. Z., Lail, B. A., . . . Boreman, G. D. (2013). Numerical modeling of scattering type scanning near-field optical microscopy. Paper presented at the Proceedings of SPIE - the International Society for Optical Engineering, 8815 doi:10.1117/12.2023513