Document Type

Conference Proceeding

Publication Title

Proceedings of SPIE - the International Society for Optical Engineering

Abstract

We showed that a hard threshold for wavelet denoising based on higher order statistics is comparable to a second order soft threshold. The hard threshold can be made adaptive by using a third order statistic as an estimate of the noise. In addition, the relationship between an adaptive hard threshold and retaining a fraction of wavelet coefficients is shown. Qualitative and quantitative metrics based on the mean-squared error are used to compare the hard thresholding and a soft-thresholding technique, BayesShrink.

DOI

10.1117/12.818719

Publication Date

3-19-2009

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