Phase resolved near-field mode imaging for the design of frequency-selective surfaces

Authors

• Edward C. Kinzel
• James C. Ginn
• Robert L. Olmon
• David J. Shelton
• Brian A. Lail
• Igal Brener
• Michael B. Sinclair
• Markus B. Raschke
• Glenn D. Boreman

Document Type

Article

Publication Title

Optics Express

Abstract

Frequency-selective surfaces (FSS) are a class of metasurfaces with engineered reflectance, absorbance, and transmittance behavior. We study an array of metallic crossed dipole FSS elements in the infrared using interferometric scattering-type scanning near-field optical microscopy (s-SNOM). We resolve the dependence of the near-field phase on the dimensions of the elements and compare with numerical models. The combined phase and amplitude information of the underlying near-field mode distribution compared to conventional far-field absorption spectroscopy greatly improves the targeted design of frequency-selective surfaces. © 2012 Optical Society of America.

First Page

11986

DOI

10.1364/OE.20.011986

Publication Date

2012

Recommended Citation

Kinzel, Edward C.; Ginn, James C.; Olmon, Robert L.; Shelton, David J.; Lail, Brian A.; Brener, Igal; Sinclair, Michael B.; Raschke, Markus B.; and Boreman, Glenn D., "Phase resolved near-field mode imaging for the design of frequency-selective surfaces" (2012). Electrical Engineering and Computer Science Faculty Publications. 363.
https://repository.fit.edu/ces_faculty/363