Document Type

Conference Proceeding

Publication Title

Proceedings of SPIE - the International Society for Optical Engineering

Abstract

We proposed a new line detection method in noisy images using Mexican hat wavelet filters. In our approach, we applied the wavelet transform in a multiresolution sense by forming the products of wavelet coefficients at the different scales to locate and identify lines at different scales. In addition, we also considered shifting line locations through multiple scales for robust line detection in the presence of noise. We found that our approach leads to an effective method to form the basis of a line detection approach.

First Page

321

Last Page

325

DOI

10.1117/12.538970

Publication Date

9-25-2003

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